Referenced Items are not available for this document.
This paper reports total dose radiation test results for high resolution 12-/14-bit A/D converters. Small changes in internal components can cause these devices to fail their specifications at relatively low total dose levels. Degradation of signal-to-noise ratio becomes increasingly important for high-accuracy converters. Rebound effects in the thick-oxide MOS devices cause these responses to be different at low and high dose rates, which is a major concern for space applications.<
Published in:
Nuclear Science, IEEE Transactions on
(Volume:41
,
Issue:
6
)
Date of Publication: Dec. 1994
- Page(s):
- 2459 - 2466
- ISSN :
- 0018-9499
- INSPEC Accession Number:
- 4871624
- Digital Object Identifier :
- 10.1109/23.340602
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 06 August 2002
- Issue Date :
- Dec. 1994
- Sponsored by :
- IEEE Nuclear and Plasma Sciences Society
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