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Single event effects in analog-to-digital converters: device performance and system impact

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3 Author(s)
Turflinger, T.L. ; Crane Div., Naval Surface Warfare Centre, Crane, IN, USA ; Davey, M.V. ; Mappes, B.M.

Monolithic analog-to-digital converters (ADCs) exhibit a large error rate in the single event effects (SEE) environment. Analysis of data from a high-performance ADC demonstrates the type of errors and their potential impact on system performance.<>

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Nuclear Science, IEEE Transactions on  (Volume:41 ,  Issue: 6 )