Cart (Loading....) | Create Account
Close category search window
 

Proton-induced charge transfer degradation in CCDs for near-room temperature applications

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Hopkins, I.H. ; SIRA/UCL Postgrad. Centr, Chislehurst, UK ; Hopkinson, G.R. ; Johlander, B.

An optical technique for measuring charge transfer inefficiency (CTI) in CCDs, operated under near-room temperature, high readout rate conditions, is described. It is possible to measure trap emission times and CTI dependence on signal size, background charge and clock waveform shape to high accuracy, both for serial and parallel transfers. It is shown that the presence of background charge (or "fat zero") can substantially improve charge transfer efficiency.<>

Published in:

Nuclear Science, IEEE Transactions on  (Volume:41 ,  Issue: 6 )

Date of Publication:

Dec. 1994

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.