Scheduled System Maintenance:
Some services will be unavailable Sunday, March 29th through Monday, March 30th. We apologize for the inconvenience.
By Topic

Space mapping technique for electromagnetic optimization

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Bandler, J.W. ; Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, Ont., Canada ; Biernacki, R. ; Shao Hua Chen ; Grobelny, P.A.
more authors

We offer space mapping (SM), a fundamental new theory to circuit optimization utilizing a parameter space transformation. This technique is demonstrated by the optimization of a microstrip structure for which a convenient analytical/empirical model is assumed to be unavailable. For illustration, we focus upon a three-section microstrip impedance transformer and a double folded stub microstrip filter and explore various design characteristics utilizing an electromagnetic (EM) field simulator. We propose two distinct EM models: coarse for fast computations, and the corresponding fine for a few more accurate and well-targeted simulations. The coarse model, useful when circuit-theoretic models are not readily available, permits rapid exploration of different starting points, solution robustness, local minima, parameter sensitivities, yield-driven design and other design characteristics within a practical time frame. The computationally intensive fine model is used to verify the space-mapped designs obtained exploiting the coarse model, as well as in the SM process itself

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:42 ,  Issue: 12 )