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Tight lower bounds on the detection probabilities of single faults at internal signal lines in combinational circuits

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2 Author(s)
Ali, S.A. ; Dept. of Electr. Eng., North Carolina A&T State Univ., Greensboro, NC, USA ; Redinbo, G.R.

A new technique for estimating a tight lower bound of the detection probabilities for single faults at any internal signal line in a combinational circuit for random testing is presented. This lower bound is calculated from the detection probabilities of all single faults at the primary input lines in a linear time. The technique relies on the relationship between the detection probabilities of dominating and dominated faults in the considered combinational circuit

Published in:

Computers, IEEE Transactions on  (Volume:43 ,  Issue: 12 )