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Reliability analysis of the double counter-rotating ring with concentrator attachments

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2 Author(s)
D. Logothetis ; Dept. of Electr. Eng., Duke Univ., Durham, NC, USA ; K. S. Trivedi

The inherently weak reliability behavior of the ring architecture has led network designers to consider various design choices to improve network reliability. We assess the impact of provisions such as node bypass, secondary ring and concentrator trees on network reliability. For this reason, we develop closed-form expressions for the reliability and the mean time-to-failure of the double counter-rotating ring architecture. For our comparisons we adopt the 2-terminal, and the all-terminal reliability criteria. Our network reliability expressions are valid for any time-to-failure distributions of links and nodes

Published in:

IEEE/ACM Transactions on Networking  (Volume:2 ,  Issue: 5 )