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Diagnosing scan chain faults

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1 Author(s)
S. Kundu ; IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA

Testing screens for good chips. However, when test fall out is high (low yield) it becomes necessary to diagnose faults so that the manufacturing process or physical design can be filed to improve yield. Several scan based diagnostic schemes are used in industry. They work when the scan chain itself is fault free. In this paper we describe a diagnosis system that can diagnose faults in a scan chain.<>

Published in:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems  (Volume:2 ,  Issue: 4 )