By Topic

Diagnosing scan chain faults

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Kundu, S. ; IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA

Testing screens for good chips. However, when test fall out is high (low yield) it becomes necessary to diagnose faults so that the manufacturing process or physical design can be filed to improve yield. Several scan based diagnostic schemes are used in industry. They work when the scan chain itself is fault free. In this paper we describe a diagnosis system that can diagnose faults in a scan chain.<>

Published in:

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on  (Volume:2 ,  Issue: 4 )