By Topic

A magnetic force microscopy analysis of soft thin film elements

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
W. Rave ; Lab. de Phys. des Solides, Univ. de Paris-Sud, Orsay, France ; L. Belliard ; M. Labrune ; A. Thiaville
more authors

Several different soft magnetic materials have been investigated by means of Magnetic Force Microscopy (MFM) using commercial Atomic Force Microscope (Nanoscope III) with slope detection. The observed contrast of basically solenoidal magnetization distributions in nanocrystalline Fe-Permalloy multilayer and single-layer Permalloy thin film elements not only reveals wall locations, and thus the subdivision of the magnetic volume into domains, but also a decomposition into subdomains hitherto undocumented. A strong influence of roughness on the magnetic fine structure is also demonstrated. Additional observations of the classical lancets of Goss texture in bulk Iron confirm the fact that the symmetries of the observed contrast are consistent with those of pendicular component of magnetization within a volume close to the sample surface

Published in:

IEEE Transactions on Magnetics  (Volume:30 ,  Issue: 6 )