By Topic

Longitudinal recording performance of sputtered barium ferrite media on a carbon rigid disk substrate

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
S. S. Rosenblum ; Appl. Electron. Center, Kobe Steel USA Inc., Palo Alto, CA, USA ; H. Hayashi ; Jinshan Li ; R. Sinclair

We report the first measurement of the longitudinal magnetic recording properties of as-deposited crystalline thin film barium ferrite media. Using facing target sputtering, randomly oriented crystalline barium ferrite (BaFe12O19, BaM) has been deposited onto an Ultra Densified Amorphous Carbon substrate, producing high quality films in-situ at a substrate temperature of 660°C without any post-deposition annealing. In order to prevent diffusion of carbon into the BaM film, an underlayer of silicon nitride was first reactively sputtered. The BaM sputtering was carried out using targets made from substituted BaM powder which had a powder Hc=1860 Oe (from Toda Kogyo) in a 10% O2/Ar gas mixture at 3 mTorr. The sputtered films had an in-plane Hc=2100 Oe. The performance of the disk was compared to a commercial disk with cobalt alloy media with Hc=1760 Oe. At a flying height of 75 nm the isolated pulse width, PW50, was 0.67 μm vs. 0.88 μm for the commercial media using a ReadRite M84 thin film head with a gap of 0.3 μm. Near its measured D50 of 66 kfci the BaM media had a broad band signal/noise ratio (SNR) of 20 dB vs. 13 dB for the commercial media

Published in:

IEEE Transactions on Magnetics  (Volume:30 ,  Issue: 6 )