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Application of Kohonen and supervised forced organisation maps to fault diagnosis in CMOS opamps

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6 Author(s)
Collins, P. ; Sch. of Eng. Inf. Technol., Sheffield Hallam Univ. ; Yu, S. ; Eckersall, K.R. ; Jervis, B.W.
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Transistors with gate oxide shorts have been identified to 100% fault coverage in a CMOS opamp by monitoring supply current changes first using multilayer perceptrons and then Kohonen maps to resolve any ambiguities. A supervised forced organisation map allows the location and resistance of the short to be determined

Published in:

Electronics Letters  (Volume:30 ,  Issue: 22 )