By Topic

High-frequency photodiode characterization using a filtered intensity noise technique

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Baney, D.M. ; Hewlett-Packard Co., Palo Alto, CA, USA ; Sorin, W.V. ; Newton, S.A.

Optical filtering of amplified spontaneous emission improves measurement dynamic range for frequency response measurements of optoelectronic receivers. For high bandwidth receivers, a novel periodically filtered intensity noise technique is proposed. Response measurements using these techniques on a 1 GHz and 30 GHz receiver are demonstrated.<>

Published in:

Photonics Technology Letters, IEEE  (Volume:6 ,  Issue: 10 )