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Boundary scan testing combined with power supply current monitoring

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3 Author(s)
Karkkainen, M. ; Electron. Lab., Tech. Res. Centre of Finland, Oulu, Finland ; Tiensyrja, K. ; Weissenfelt, M.

The monitoring of power supply current is presented for detecting manufacturing defects in printed circuit boards. Simple and inexpensive test equipment consisting of PC and interface card has been developed to support current monitoring by utilizing IEEE 1149.1 standard test architecture

Published in:

European Design and Test Conference, 1994. EDAC, The European Conference on Design Automation. ETC European Test Conference. EUROASIC, The European Event in ASIC Design, Proceedings.

Date of Conference:

28 Feb-3 Mar 1994

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