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Predicting circuit performance using circuit-level statistical timing analysis

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5 Author(s)
Brawhear, R.B. ; Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA ; Menezes, N. ; Chanhee Oh ; Pillage, L.T.
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Recognizing that the delay of a circuit is extremely sensitive to manufacturing process variations, this paper proposes a methodology for statistical timing analysis. The authors present a triple-node delay model which inherently captures the effect of input transition time on the gate delays. Response surface methods are used so that the statistical gate delays are generated efficiently. A new path sensitization criterion based on the minimum propagatable pulse width (MPPW) of the gates along a path is used to check for false paths. The overlap of a path with longer paths determines its “statistical significance” to the overall circuit delay. Finally, the circuit delay probability density function is computed by performing a Monte Carlo simulation on the statistically significant path set

Published in:

European Design and Test Conference, 1994. EDAC, The European Conference on Design Automation. ETC European Test Conference. EUROASIC, The European Event in ASIC Design, Proceedings.

Date of Conference:

28 Feb-3 Mar 1994

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