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An efficient yield optimization method using a two step linear approximation of circuit performance

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2 Author(s)
Wang, Z. ; Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA ; Director, S.W.

A novel method for the estimation of yield of integrated circuits based on a two step linear approximation of circuit performance is proposed. By using this method, only one complete circuit simulation is needed for the estimation of yield. A new algorithm for yield optimization is also presented. It is based on the random direction stochastic approximation and does not require the evaluation of yield gradients. Examples are given to demonstrate the efficiency of the algorithm

Published in:

European Design and Test Conference, 1994. EDAC, The European Conference on Design Automation. ETC European Test Conference. EUROASIC, The European Event in ASIC Design, Proceedings.

Date of Conference:

28 Feb-3 Mar 1994

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