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A model-based approach to analog fault diagnosis using techniques from optimisation

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3 Author(s)
Ahmed, S. ; Dept. of Electr. and Electron. Eng., Imperial Coll. of Sci., Technol. & Med., London, UK ; Cheung, P.Y.K. ; Collins, P.

This paper describes a new model-based approach for analog fault diagnosis that can diagnose, without needing an excessive number of measurements, both catastrophic faults due to open/short circuiting and parametric faults, in linear and nonlinear circuits. The approach can deal with both single and multiple faults, and can be used for diagnosis of DC and AC circuits. It takes account of the parameter tolerances and measurement errors in the circuit under test (CUT) using techniques from optimisation

Published in:

European Design and Test Conference, 1994. EDAC, The European Conference on Design Automation. ETC European Test Conference. EUROASIC, The European Event in ASIC Design, Proceedings.

Date of Conference:

28 Feb-3 Mar 1994