Cart (Loading....) | Create Account
Close category search window
 

Functional tests for ring-address SRAM-type FIFOs

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
van de Goor, A.J. ; Delft Univ. of Technol., Netherlands ; Zorian, Y. ; Schanstra, I.

First-In-First-Out (FTFO) memories are becoming increasingly popular as buffer storage between subsystems operating at different data rates. One way to implement a FIFO is to use a dual-port SRAM memory with a ring-address mechanism consisting of an n-bit shift register (n is the number of words in the FIFO). This saves the address decoder circuitry and allows for higher speed operation, which makes this type of FIFO very popular, especially for embedded applications. The well-known functional tests for SRAMs cannot be applied to FIFOs, because of their built-in access restrictions. Functional fault models and functional tests for ring-address SRAM-type FIFOs have not been documented before; this paper aims at filling in this gap. It introduces functional fault models and presents a set of tests for ring-address SRAM-type FIFOs

Published in:

European Design and Test Conference, 1994. EDAC, The European Conference on Design Automation. ETC European Test Conference. EUROASIC, The European Event in ASIC Design, Proceedings.

Date of Conference:

28 Feb-3 Mar 1994

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.