Referenced Items are not available for this document.
Novel CMOS circuits are described for the on-chip measurement of capacitor ratios. They can provide a high-accuracy A/D interface for capacitive sensors, or allow the precise calibration of switched-capacitor DACs, amplifiers and other circuits utilizing ratioed capacitors. Various structures are proposed and the limitations of their accuracy are analyzed. Computer simulations illustrate the operation and verify the anticipated robustness and high accuracy of the system even in the presence of nonidealities
Published in:
Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on
(Volume:41
,
Issue:
9
)
Date of Publication: Sep 1994
- Page(s):
- 637 - 639
- ISSN :
- 1057-7130
- INSPEC Accession Number:
- 4804038
- Digital Object Identifier :
- 10.1109/82.326597
- Date of Current Version :
- 06 August 2002
- Issue Date :
- Sep 1994
- Sponsored by :
- IEEE Circuits and Systems Society
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