Scheduled System Maintenance:
On Monday, April 27th, IEEE Xplore will undergo scheduled maintenance from 1:00 PM - 3:00 PM ET (17:00 - 19:00 UTC). No interruption in service is anticipated.
By Topic

Refractive index profiling-state of the art

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
3 Author(s)
Raine, K.W. ; NPL, Teddington, UK ; Baines, J.G.N. ; Putland, D.E.

Problems associated with different calibration techniques and some instrumental effects that can determine instrumental accuracy are discussed. It is shown how transmission effects can be observed and used to generate a correction curve for refracted near-field instruments. High-quality fiber slices needed for axial interferometry were used to obtain refractive index differences on suitable fibers to ±1% with the measurements traceable to national standards. Interferometry was used to calibrate a multiple-step fiber which is available in 10-m lengths with a certificate of calibration. The limitations of the technique are discussed, and preliminary results of a study on the effects of residual stress and stress relief on measurements are given. Comparisons are made between measurements made by axial interferometry and refracted near field on a range of fibers. It is shown that commercial profilers can produce reliable measurements of refractive index difference, absolute refractive index, profile shape, and numerical aperture that agree well with measurements by other techniques

Published in:

Lightwave Technology, Journal of  (Volume:7 ,  Issue: 8 )