Cart (Loading....) | Create Account
Close category search window
 

An integrated 16-channel CMOS time to digital converter

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)

An integrated 16-channel Time to Digital Converter (TDC) for use in the NA48 experiment at CERN has been developed in a 1 μm CMOS technology. The resolution is 156ns and the total time history is 204.8 ms. Buffering of up to 128 hits is done in on-chip FIFOs. The chip area is 25 mm2. The vernier circuit consists of a 16-tap voltage-controlled delay chain controlled by a Delay Locked Loop (DLL). Read out is possible at 40 MHz. JTAG/IEEE 1149.1 protocol has been incorporated to allow in-site testing of the chip. The JTAG data path is also used to access internal control and status registers

Published in:

Nuclear Science, IEEE Transactions on  (Volume:41 ,  Issue: 4 )

Date of Publication:

Aug 1994

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.