By Topic

Microwave diversity imaging and automated target identification based on models of neural networks

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Farhat, N.H. ; Dept. of Electr. Eng., Pennsylvania Univ., Philadelphia, PA, USA

Radar targets can be identified by either forming images with sufficient resolution to be recognized by the human observer or by forming signatures or representations of the target for automated machine recognition. Tomographic microwave diversity imaging techniques that combine angular (aspect), spectral, and polarization degrees of freedom have been shown, as summarized in the first part of this paper, to be capable of producing images of the scattering centers of a target with near optical resolution. In the second part of the paper the author shows that collective nonlinear signal processing based on models of neural networks combined with the use of suitable target signatures (here sinogram representations) offer the promise of robust super-resolved target identification from partial information. Results presented are of numerical simulations for a neuromorphic processor where the neural net performs simultaneously the functions of data storage, processing, and recognition by automatically generating an identifying object label, and fast optoelectronic architectures and hardware implementations are briefly mentioned. Practical considerations and extensions to real systems are briefly discussed

Published in:

Proceedings of the IEEE  (Volume:77 ,  Issue: 5 )