Cart (Loading....) | Create Account
Close category search window
 

SLIDE: subspace-based line detection

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Aghajan, H.K. ; Dept. of Electr. Eng., Stanford Univ., CA, USA ; Kailath, T.

The SLIDE (subspace-based line detection) algorithm, a technique for estimating parameters of multiple straight lines in an image, is described. By reformulating the line fitting problem into a spectral estimation framework, SLID exploits subspace-based techniques of sensor array processing to obtain high resolution and closed-form estimates for the line parameters. The computational complexity of SLIDE is an order of magnitude less than that of the Hough transform method, and, unlike the Hough transform, SLIDE does not require a search procedure to estimate the parameters. Potential application areas of this technique include road tracing in robotic vision, aerial image analysis, mask-wafer alignment and linewidth measurement in semiconductor manufacturing, and text alignment in document analysis.<>

Published in:

Acoustics, Speech, and Signal Processing, 1993. ICASSP-93., 1993 IEEE International Conference on  (Volume:5 )

Date of Conference:

27-30 April 1993

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.