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Browse Journals & Magazines > Electronics Letters ...> Volume:25 Issue:14 Help

Techniques for bit error rate measurement using Chebyshev inequality

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1 Author(s)
Stevan, B. ; Vojnotehnicki Inst., Beograd, Yugoslavia

Techniques for bit error rate (BER) measurement using either a fixed-length test sequence or a fixed number of received errors are presented. Expressions for the number of bits in the test sequence and the number of errors at the receiving side are derived.

Published in:
Electronics Letters  (Volume:25 ,  Issue: 14 )

Date of Publication: 6 July 1989

Page(s):
927 - 929
ISSN :
0013-5194
INSPEC Accession Number:
3455416
Digital Object Identifier :
10.1049/el:19890622
Product Type:
Journals & Magazines
Date of Current Version :
06 August 2002
Issue Date :
6 July 1989
Sponsored by :
Institution of Engineering and Technology

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