Cart (Loading....) | Create Account
Close category search window
 

State estimation and observability analysis based on echelon forms of the linearized measurement models

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Falcao, D.M. ; COPPE-EE, Federal Univ. of Rio de Janeiro, Brazil ; Arias, M.A.

This paper introduces an alternative approach for power system state estimation and observability analysis. The method is based on the analysis of the active and reactive linearized measurement models in the echelon form. This form is a generalization of matrix triangular factorization for the case of rectangular matrices. The proposed approach represents an evolution of the least absolute value state estimation method. The state estimate produced by the proposed method presents some of the basic characteristics of that obtained with the least absolute value estimator but the overall methodology is simpler and more general while unifying measurement noise filtering, bad data detection and identification, and observability analysis under the same algorithmic framework

Published in:

Power Systems, IEEE Transactions on  (Volume:9 ,  Issue: 2 )

Date of Publication:

May 1994

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.