By Topic

Single event upsets for Space Shuttle flights of new general purpose computer memory devices

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
O'Neill, P.M. ; NASA Johnson Space Center, Houston, TX, USA ; Badhwar, G.D.

The replacement of the magnetic core with a well characterized semiconductor memory in the Space Shuttle orbiter general purpose computers (GPCs) has provided a wealth of on-orbit radiation effects data since 1991. The fault tolerant GPCs detect, correct, and downlink memory upset status and orbiter position information every few seconds, giving the ability to correlate 1400 upsets to date with altitude, geomagnetic latitude, and solar conditions. The predicted upset rate was computed by a modified path-length distribution method. The modification accounts for the Weibull distribution cross-section (rather than a single upset threshold) and the device sensitive volume thickness. Device thickness was estimated by the method normally used to account for edge effects at the upset cross-section discontinuity that occurs at ion changes. A Galactic cosmic ray environment model accurately models the average particle flux for each mission. The predicted and observed upset rates were found to be in good agreement for sensitive volume thicknesses consistent with the device's fabrication technology

Published in:

Nuclear Science, IEEE Transactions on  (Volume:41 ,  Issue: 5 )