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Logic design verification via test generation

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3 Author(s)
M. S. Abadir ; Microelectron. & Comput. Technol. Corp., Austin, TX, USA ; J. Ferguson ; T. E. Kirkland

A method for logic design verification is introduced in which a gate-level implementation of a circuit is compared with a functional-level specification. In this method, test patterns that were developed to detect single stuck-line faults in the gate-level implementation are used instead to compare the gate-level implementation with the functional-level specification. In the presence of certain hypothesized design errors, such a test set will produce responses in the implementation that disagree with the responses in the specification. It is shown that the class of design errors that can be detected in this way is very large

Published in:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems  (Volume:7 ,  Issue: 1 )