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SOCRATES: a highly efficient automatic test pattern generation system

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3 Author(s)
Schulz, M.H. ; Inst. of Comput. Aided Design, Tech. Univ. of Munich, West Germany ; Trischler, E. ; Sarfert, T.M.

An automatic test pattern generation system, SOCRATES, is presented. SOCRATES includes several novel concepts and techniques that significantly improve and accelerate the automatic test pattern generation process for combinational and scan-based circuits. Based on the FAN algorithm, improved implication, sensitization, and multiple backtrace procedures are described. The application of these techniques leads to a considerable reduction of the number of backtrackings and an earlier recognition of conflicts and redundancies. Several experiments using a set of combinational benchmark circuits demonstrate the efficiency of SOCRATES and its cost-effectiveness, even in a workstation environment

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Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:7 ,  Issue: 1 )