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Multiple fault detection using single fault test sets

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1 Author(s)
Hughes, J.L.A. ; Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA

A simulation study of the 74LS181 4-b ALU (arithmetic logic unit) using 16 complete single stuck-at fault test sets demonstrated significantly higher multiple stuck-at fault coverage than predicted by previous theoretical studies. Analysis of the undetected multiple faults shows the effect of circuit and test set characteristics on fault coverage. A fault masking property, defined as self-masking, is observed for the undetected faults in the simulation study. A heuristic is described for evaluating the multiple fault coverage of single stuck-at fault test sets. A second heuristic generates augmented test sets, providing improved multiple stuck-at fault coverage with a minimal increase in test set development cost

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:7 ,  Issue: 1 )

Date of Publication:

Jan 1988

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