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A useful and challenging take-home examination: characterization of an imaginary semiconductor sample

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1 Author(s)
Listerman, T.W. ; Dept. of Phys., Wright State Univ., Dayton, OH, USA

A take-home examination required students in a semiconductor device physics course to clarify their understanding of the properties of semiconductors. Students were given numerical values of measurements “made” on an imaginary semiconductor and then asked to determine the semiconductor's physical characteristics

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Education, IEEE Transactions on  (Volume:37 ,  Issue: 3 )