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Browse Journals & Magazines > Microwave Theory and Techniqu ...> Volume:37 Issue:8 Help

Millimeter-wave monolithic integrated circuit characterization by a picosecond optoelectronic technique

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6 Author(s)
Hung, H.-L.A. ; COMSAT Labs., Clarksburg, MD, USA ; Polak-Dingels, P. ; Webb, K.J. ; Smith, T.
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The characterization of microwave and millimeter-wave monolithic integrated circuits (MIMICs) using picosecond pulse-sampling techniques is developed with emphasis on improving broadband coverage and measurement accuracy. GaAs photoconductive switches are used for signal generation and sampling operations. The measured time-domain response allows the spectral transfer function of the MIMIC to be obtained. This measurement technique is verified by characterization of the frequency response (magnitude and phase) of a reference 50-Ω microstrip line and a two-stage Ka-band MIMIC amplifier. The measured broadband results agree with those obtained from conventional frequency-domain measurements using a network analyzer. The application of this optical technique to on-wafer MIMIC characterization is described

Published in:
Microwave Theory and Techniques, IEEE Transactions on  (Volume:37 ,  Issue: 8 )

Date of Publication: Aug 1989

Page(s):
1223 - 1231
ISSN :
0018-9480
INSPEC Accession Number:
3476823
Digital Object Identifier :
10.1109/22.31083
Product Type:
Journals & Magazines
Date of Current Version :
06 August 2002
Issue Date :
Aug 1989
Sponsored by :
IEEE Microwave Theory and Techniques Society

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