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A method for determination of microwave surface impedance of high-T c thick film and bulk superconductors

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2 Author(s)
Zhipeng Wu ; Dept. of Electr. Eng. & Electron., Univ. of Manchester Inst. of Sci. & Technol., UK ; L. E. Davis

A resonator method is presented which enables R, and X8 to be determined as a function of temperature with the exclusion of the thermal expansion effect. Results for R, and X, are given for a bulk YBCO sample at 13 GHz over the range 15-190 K. Good agreement with the “enhanced” two-fluid model is found for λ(T), and λ=657 nm at 77 K

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IEEE Transactions on Instrumentation and Measurement  (Volume:43 ,  Issue: 4 )