Cart (Loading....) | Create Account
Close category search window

A resonator impedance de-embedding procedure

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Wheless, W.P., Jr. ; Dept. of Electr. Eng., Alabama Univ., Tuscaloosa, AL, USA

In many contemporary high-frequency circuits, a dielectric resonator is coupled to a microstrip line section, the ends of which constitute a two-port. A detailed procedure is presented for recovery of impedance values associated with the resonator from S-parameter measurements on the two-port with a vector network analyzer. The procedure is suitable for computer-assisted numerical processing, takes into account lossy propagation and moderate impedance vagaries along the microstrip line, and includes discontinuities in the coax-to-microstrip transitions. Resonant frequency, unloaded Q, and effective coupling coefficient can be determined subsequently from the de-embedded impedance values

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:38 ,  Issue: 4 )

Date of Publication:

Aug 1989

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.