By Topic

Design and operation of button-probe, beam-position measurements

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Gilpatrick, J.D. ; Los Alamos Nat. Lab., NM, USA ; Power, J.F. ; Meyer, R.E. ; Rose, C.R.

Beam position measurement systems have been installed on the Advanced Free Electron Laser (AFEL) facility at Los Alamos National Laboratory. The position measurement uses a capacitive- or button-style probe that differentiates the beam-bunch charge distribution induced on each of the four probe lobes. These induced signals are fed to amplitude-to-phase processing electronics that provide output signals proportional to the arc tangent of the probe's opposite-lobe, signal-voltage ratios. An associated computer system then digitizes and linearizes these processed signals based on theoretical models and measured responses. This paper will review the processing electronics and capacitive probe responses by deriving simple theoretical models and comparing these models to actual measured responses

Published in:

Particle Accelerator Conference, 1993., Proceedings of the 1993

Date of Conference:

17-20 May 1993