Cart (Loading....) | Create Account
Close category search window
 

Status and design of the Advanced Photon Source control system

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
McDowell, W. ; Adv. Photo Source, Argonne Nat. Lab., IL, USA ; Knott, M. ; Lenkszus, F. ; Kraimer, M.
more authors

This paper presents the current status of the Advanced Photon Source (APS) control system. It discusses the design decisions which led us to use industrial standards and collaborations with other laboratories to develop the APS control system. The system uses high performance graphic workstations and the X-windows graphical user interface (GUI) at the operator interface level. It connects to VME/VXI-based microprocessors at the field level using TCP/IP protocols over high performance networks. This strategy assures the flexibility and expansibility of the control system. A defined interface between the system components will allow the system to evolve with the direct addition of future, improved equipment and new capabilities

Published in:

Particle Accelerator Conference, 1993., Proceedings of the 1993

Date of Conference:

17-20 May 1993

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.