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Simulation of cold-test dispersion and interaction impedances for coupled-cavity tube slow-wave circuits

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4 Author(s)
Kory, C.L. ; Analex Corp., Cleveland, OH, USA ; Wilson, J.D. ; Maruschek, J.W. ; Schroeder, D.L.

The cold-test dispersion and interaction impedance characteristics for three types of coupled-cavity slow-wave circuits were simulated with the frequency-domain algorithm of Micro-SOS, a three-dimensional electromagnetic simulation code. The results agree very closely with experimental data and show the utility of the simulation code for eliminating the need for expensive and time-consuming experimental cold-testing procedures.<>

Published in:

Electron Devices Meeting, 1992. IEDM '92. Technical Digest., International

Date of Conference:

13-16 Dec. 1992