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A covariance model for the yield of large memory chips

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3 Author(s)
Stapper, C.H. ; IBM Technol. Products, Essex Junction, VT, USA ; Retersdorf, M.A. ; Rosner, L.G.

Data from 4-Mb and 16-Mb memory chips show that a new method is required to predict the yield of very large memory chips with redundant word and bit lines. A model developed to do this indicates that gigabit memory chips, with a yield of less than 90%, may be less productive than 256-Mb "cut-down" chips.<>

Published in:

Electron Devices Meeting, 1992. IEDM '92. Technical Digest., International

Date of Conference:

13-16 Dec. 1992