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A WSI approach towards defect/fault-tolerant reconfigurable serial systems

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4 Author(s)
Chen, W. ; Dept. of Electr. Eng., Edinburgh Univ., UK ; Mavor, John ; Denyer, P.B. ; Renshaw, D.

A superchip for realizing ultra-large-scale integrated (ULSI) systems based on a wafer-scale integrated (WSI) circuit concept, which incorporates defect/fault tolerance and system reconfiguration, is introduced. The key features of the central architectural component, a large crossbar switch matrix, are described. A prototype has been fabricated in silicon technology. Hypothetical processor examples demonstrate the power of the superchip approach, and design/performance figures are discussed.<>

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Solid-State Circuits, IEEE Journal of  (Volume:23 ,  Issue: 3 )