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Burnout sensitivity of power MOSFETs operating in a switching converter

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4 Author(s)
Tastet, P. ; CNES, Toulouse, France ; Garnier, J. ; Constans, H. ; Tizon, A.H.

Heavy ion tests of a switching converter using power MOSFETs have allowed us to identify the main parameters which affect the burnout sensitivity of these components. The differences between static and dynamic conditions are clarified in this paper

Published in:

Nuclear Science, IEEE Transactions on  (Volume:41 ,  Issue: 3 )

Date of Publication:

Jun 1994

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