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Results from the CRRES MEP experiment

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4 Author(s)
Campbell, A. ; Naval Res. Lab., Washington, DC, USA ; McDonald, P. ; Gonyea, R. ; Reeves, M.

The effects of space radiation on microelectronics devices will be presented as measured by the Microelectronics Package Space Experiment on the Combined Release and Radiation Effects Satellite

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Nuclear Science, IEEE Transactions on  (Volume:41 ,  Issue: 3 )