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A model for impulsive EMI effects caused by low voltage ESD

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1 Author(s)
M. Honda ; Nihon Unisys. Ltd., Yokohama, Japan

A model for impulsive electromagnetic interference (EMI) effects caused by relatively low-voltage electrostatic discharge (ESD) on digital electronic systems is proposed. The power of impulsive EMI is governed by the product of the following three parameters: charged voltage, rise time of the discharge current, and susceptibility of the system

Published in:

Industry Applications Society Annual Meeting, 1993., Conference Record of the 1993 IEEE

Date of Conference:

2-8 Oct 1993