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Extracting double layer charge density distributions using the method of moments

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6 Author(s)
Lonngren, Karl E. ; Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA ; Schwartz, P.V. ; Er-Wei Bai ; Theisen, W.C.
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Using the method of moments, it is shown that the charge distribution can be directly extracted from a measured potential profile. The technique is described and placed on a theoretical foundation. The predicted charge distribution for a potential profile V=V0 tanh (x/L) using this technique is compared with a direct solution of Poisson's equation. It is shown that similar results are obtained even if random noise is present in the system

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Plasma Science, IEEE Transactions on  (Volume:22 ,  Issue: 3 )