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Effect of RuO2 on the behavior of silver at thick-film terminations

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2 Author(s)
Yamaguchi, T. ; Fac. of Sci. & Technol., Keio Univ., Yokohama, Japan ; Kageyama, Makiko

In an attempt to understand the silver-glass interactions at the electrode/resistor terminations in hybrid integrated circuits, the behavior of silver in binary 75PbO-25SiO2 glass containing up to 20 wt.% RuO2 particles was studied between 650 and 850°. It is shown that the dissolution of silver into glass increases with increasing amount of RuO2 particles. A different temperature dependence of dissolution was observed for RuO2-free and RuO2-doped glasses. Silver-ion-RuO 2 interactions have been proposed as a possible mechanism responsible for the increased dissolution of silver in the glass

Published in:

Components, Hybrids, and Manufacturing Technology, IEEE Transactions on  (Volume:11 ,  Issue: 1 )

Date of Publication:

Mar 1988

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