Cart (Loading....) | Create Account
Close category search window

Spectral analysis of optical mixing measurements

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Nazarathy, M. ; Hewlett-Packard Labs., Palo Alto, CA, USA ; Sorin, W.V. ; Baney, D.M. ; Newton, S.A.

A general rigorous theory of optical heterodyne and homodyne measurements is presented. The power spectrum of the photocurrent resulting from two uncorrelated optical beams mixing on a photodetector is derived. In particular, a rigorous analysis is presented for the delayed self-homodyne method which is used to characterize laser source linewidth by a Mach-Zehnder interferometer with a delay exceeding the source coherence length. Existing treatments are generalized to address non-Lorentzian laser sources of arbitrary lineshape. The analysis is further generalized to cover the case of modulated nonstationary sources. An example of the application of this theory is given. It is shown how the theory may be used to interpret an experimental result obtained using the gated delayed self-homodyne technique for characterizing the frequency chirp of laser sources under modulation

Published in:

Lightwave Technology, Journal of  (Volume:7 ,  Issue: 7 )

Date of Publication:

Jul 1989

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.