By Topic

Polarization-mode dispersion measurements based on transmission spectra through a polarizer

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
C. D. Poole ; Crawford Hill Lab., AT&T Bell Labs., Holmdel, NJ, USA ; D. L. Favin

Routine characterization of polarization-mode dispersion (PMD) in single-mode fiber, both at the manufacturing stage and in installed systems, requires an easy-to-implement measurement technique. One method that is particularly simple to implement involves counting the number of extrema (i.e., maxima and minima) per unit wavelength interval in the transmission spectrum measured through a polarizer (analyzer) placed at the output of a test fiber. In this paper, we establish accurate equations relating both the extrema density and mean-level crossing densities in such spectra to the expected value of PMD. These equations are used to measure several fiber samples, and are compared to measured values obtained with a commercially available test set. It is shown that measuring both mean-level crossings and extrema densities provides a simple means for establishing whether a fiber is scaling as √L (long-length regime) or L (short-length regime). Using Monte Carlo simulations, the accuracy of the fixed-analyzer measurements is examined as a function of the width of the wavelength interval over which measurements are made. In addition, the simulations indicate that fixed-analyzer measurements are quite robust with respect to the presence of polarization-dependent loss (PDL) in the span, an important consideration for measurements in amplified systems

Published in:

Journal of Lightwave Technology  (Volume:12 ,  Issue: 6 )