Cart (Loading....) | Create Account
Close category search window

Radar backscattering from artificially grown sea ice

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Bredow, J. ; Kansas Univ., Lawrence, KS, USA ; Gogineni, S.P. ; Gow, A.J. ; Blanchard, P.F.
more authors

Fine-resolution X-band backscatter measurements were made at the US Army Cold Region Research and Engineering Laboratory in Jan. 1987. Backscatter data were collected from unmodified smooth ice and snow-covered ice and from ice from which the snow had been removed (slightly roughened ice). The results indicate that vertically polarized returns were consistently higher than horizontally polarized echoes from both the slightly roughened and snow-covered saline ice. A 6.5-cm-thick dry snow layer altered the σo of the original smooth-surfaced saline ice only slightly, but introduced a noticeable volume scattering component. It is shown that although substantial agreement exists between the bare first-year ice measurements and commonly used surface-scatter model predictions, a complete model of first-year ice must include a volume-scatter contribution

Published in:

Oceanic Engineering, IEEE Journal of  (Volume:14 ,  Issue: 3 )

Date of Publication:

Jul 1989

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.