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On robustness of required random test length with regard to fault occurrence hypotheses

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3 Author(s)
Crepaux, S. ; CNRS, Grenoble, France ; Jacomino, M. ; David, R.

For random test length evaluation, the usual approach considers only the fault that is most difficult to detect; this is pessimistic. The fault distribution in the batch of tested circuits should be taken into account. Since this information is not known before the test experiment, hypotheses on fault occurrence probabilities have to be made. This paper shows, through several simulations, that the test length does not depend very much on the fault occurrence hypotheses

Published in:

VLSI Test Symposium, 1994. Proceedings., 12th IEEE

Date of Conference:

25-28 Apr 1994