By Topic

Finding line segments by stick growing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Nelson, R.C. ; Dept. of Comput. Sci., Rochester Univ., NY, USA

A method is described for extracting lineal features from an image using extended local information to provide robustness and sensitivity. The method utilizes both gradient magnitude and direction information, and incorporates explicit lineal and end-stop terms. These terms are combined nonlinearly to produce an energy landscape in which local minima correspond to lineal features called sticks that can be represented as line segments. A hill climbing (stick-growing) process is used to find these minima. The method is compared to two others, and found to have improved gap-crossing characteristics

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:16 ,  Issue: 5 )