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Component tolerance and circuit performance: a case study

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1 Author(s)
R. V. White ; AT&T Bell Lab., Mesquite, TX, USA

The author presents a continuation of work presented at APEC 1992 (see p.28-35), in which a simple circuit was simulated to predict yield in the manufacturing process. The simulation results had some anomalies. This was because the component values were assumed to be uniformly distributed between the tolerance limits. The author updates that assumption, and uses normally distributed component values. Various simulations are run with varying component tolerance and quality levels. From the mean and variance of the simulated results, plots are made that show the specification limits that would have to be set to meet a given yield requirement

Published in:

Applied Power Electronics Conference and Exposition, 1993. APEC '93. Conference Proceedings 1993., Eighth Annual

Date of Conference:

7-11 Mar 1993