A diagnosable and repairable k-valued cellular array is proposed, assuming a single fault, i.e., either a stuck-at-0 fault or a stuck-at-(k-1) fault of switches, occurs in the array. By building in a duplicate column iteratively, a fault-tolerant array can be constructed for the stuck-at-(k-1) fault, therefore, since the stuck-at-(k-1) fault need not be diagnosed, the diagnosis is simple and easy. Furthermore, the array can be repaired easily by a systematic procedure. A comparison with other rectangular arrays shows that the present array has advantages with respect to the number of cells and steps for generating all test inputs
Published in:
Multiple-Valued Logic, 1993., Proceedings of The Twenty-Third International Symposium on
Date of Conference:
24-27 May 1993
- Page(s):
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92
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97
- Meeting Date :
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24 May 1993-27 May 1993
- Print ISBN:
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0-8186-3350-6
- INSPEC Accession Number:
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4677153
- Conference Location :
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Sacramento, CA
- Digital Object Identifier :
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10.1109/ISMVL.1993.289575