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A repairable and diagnosable cellular array on multiple-valued logic

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3 Author(s)
N. Kamiura ; Fac. of Eng., Himeji Inst. of Technol., Japan ; Y. Hata ; K. Yamato

A diagnosable and repairable k-valued cellular array is proposed, assuming a single fault, i.e., either a stuck-at-0 fault or a stuck-at-(k-1) fault of switches, occurs in the array. By building in a duplicate column iteratively, a fault-tolerant array can be constructed for the stuck-at-(k-1) fault, therefore, since the stuck-at-(k-1) fault need not be diagnosed, the diagnosis is simple and easy. Furthermore, the array can be repaired easily by a systematic procedure. A comparison with other rectangular arrays shows that the present array has advantages with respect to the number of cells and steps for generating all test inputs

Published in:

Multiple-Valued Logic, 1993., Proceedings of The Twenty-Third International Symposium on

Date of Conference:

24-27 May 1993