Cart (Loading....) | Create Account
Close category search window
 

Development of a 3D gradient-based method for volume quantitation in SPECT

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Long, D.T. ; Dept. of Nucl. Med., Massachusetts Univ. Med. Center, Worcester, MA, USA ; King, M.A. ; Gennert, Michael A.

A three-dimensional (3-D) method for quantifying organ and lesion volume in SPECT (single photon emission computed tomography) is described. A 3-D edge-detection technique based on a 3-D gradient operator is used to define the boundary of a radionuclide distribution in typical low-contrast, high-noise SPECT images. The method combines pre- and post-reconstruction filtering of the SPECT images with a 3-D adaptation of interpolative background subtraction to provide adequate noise reduction for reliable boundary definition. Simulation studies have shown that the method provides a direct measurement of relatively small volumes in SPECT images with good reproducibility and minimal operator bias. The method is applicable to quantifying the volume of hot and cold lesions

Published in:

Nuclear Science, IEEE Transactions on  (Volume:38 ,  Issue: 2 )

Date of Publication:

Apr 1991

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.