Cart (Loading....) | Create Account
Close category search window
 

Maximum likelihood estimation of synchronous machine parameters from flux decay data

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Tumageanian, A. ; Gen. Electr. Co., Schenectady, NY, USA ; Keyhani, A. ; Seung-Ill Moon ; Leksan, T.I.
more authors

A time-domain system identification procedure to estimate the parameters of a 5 kVA salient pole synchronous machine from standstill test measurements is proposed. The test consists of a DC flux decay signal applied to the d-axis and q-axis of the machine. From the recorded responses to this signal, the admittance transfer function models and the standstill frequency response equivalent circuit models are identified. The maximum likelihood algorithm is used to estimate the model parameter values, and the Akaike Criterion is used to select the best-fit model. The performance of the standstill models in the dynamic environment is studied through simulation of an on-line small-disturbance test. The results are compared with measured data

Published in:

Industry Applications, IEEE Transactions on  (Volume:30 ,  Issue: 2 )

Date of Publication:

Mar/Apr 1994

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.